Abstract
At 1Tbit/in2 areal density magnetic recording dimensions, reliable magnetic field metrology does not exist. One technique to map the spatial profile of the magnetic field of a write head is to use a contact read/write tester. A magnetic recording head is brought into contact with a Hall sensor, and is subsequently scanned with nm resolution. For a 300nm track width longitudinal recording head, the magnetic field of the head was mapped. Measurements include the down track field gradient and cross-track field profile and the current-field transfer curve. These results suggest this technique offers a viable write field metrology.
Published Version
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