Abstract
We describe a new way to measure the refractive index of dielectric materials using a time-resolved correlation method. By measuring the time delay of femtosecond pulse trains through a dielectric material, we obtain the refractive index of the material. This technique is direct, less surface sensitive, and precise to four digits. Consequently, it gives a true bulk index value. We apply this technique to measure the refractive index of fused silica, InP, and GaAs in the near infrared spectral regime.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
