Abstract

Recently, our group reported a novel solid-state electrolyte material which is constituted of a nano-porous SiO2 monolith and an ionic liquid electrolyte (ILE) which occupies the pores. The unique feature of this solid nano-composite electrolyte (nano-SCE) is its ion conductivity which is higher than that of the ILE itself [1]. Here, we report a direct measurement of this enhanced ion conductivity by measuring the ion conductivity of a thin-film ILE on a planar SiO2 substrate. The enhanced ion conductivity is directly measured with interdigitated electrode arrays deposited on a planar SiO2 substrate, as shown in Figure 1. By depositing a thin-film ILE film on these electrodes, the impedance response of the ILE/SiO2 interface could be measured by impedance spectroscopy (IS). The ion conductivity on the ILE/SiO2 interface could subsequently be quantified by analysis of the equivalent circuit model and by measuring the ILE film thickness. The ILE film thickness is scaled down to the nanometer regime. This is the first time that such thin ILE films could be deposited using liquid processing techniques. The enhanced ion conductivity is revealed when the ILE film thickness is reduced to 20 nm thicknesses and below. The ion conductivity of the ILE films with a thickness around 80 nm have a similar conductivity compared to the bulk ILE. Enhanced ion conductivity along interfaces has been observed before and is typically referred to as heterogenous doping [2]. The mechanism that governs the enhanced conductivity in the nano-SCE are similar to those described by heterogenous doping. However, the ion conductivities measured in this work are many times higher compared to those reported before. In conclusion, for the first time ILE thin-films with thicknesses in the nanometer regime are deposited with liquid processing. Moreover, the ion conductivity at the ILE/SiO2 interface could be quantified and showed an increased conductivity compared to the bulk ILE value.

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