Abstract
A method of measurement of capacitance is described wherein the unknown capacitance can be directly read. Measurements are done using 1 MHz stable crystal controlled oscillator. A two stage amplifier is used to amplify the low level signal before it is rectified and displayed. This was used in plotting the impurity profile in epitaxial layers on GaAs crystals.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
