Abstract
In order to investigate the dielectric properties of low loss dielectrics over a wide range of characteristic times (approximately up to 10 ps) a Time-Domain Reflectometry (TDR) technique is reported in this paper. The data analysis is achieved in time-domain directly, for this purpose a new deconvolution technique has been developed. Experimental examples are provided to illustrate that the results deduced with this technique are in very good agreement with those obtained by frequency-domain measurements.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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