Direct correlation of microstructure and device performance of liquid phase crystallized Si thin film solar cells on glass

Abstract

Si thin films on glass grown by liquid phase crystallization (LPC) exhibit large grains resembling those in multicrystalline Si wafers. The present work gives direct insight into how planar defects in LPC‐Si thin films influence the device performance of the corresponding solar cells by acquiring electron‐backscatter diffraction maps and measuring solar cell parameters on the same identical positions. By this approach, it was possible to demonstrate how low scanning velocities of the laser line during the crystallization lead to lower densities of grain boundaries, to improved charge‐carrier diffusion lengths, and hence to improved device performances. magnified imageOrientation‐distribution map acquired by electron backscatter diffraction on a Si thin film crystallized via liquid phase crystallization.