Abstract
The analytical potential of direct arc atomic emission detection of impurities in rare earth oxides (Y2O3, Cd2O3, and Nd2O3) on a Grand-Extra high-resolution spectrometer (VMK-Optoelektronika, Russia) is assessed. The conditions of analysis and spectrometer parameters are optimized. The detection threshold and lower limits for the content of a number of rare earth elements (Nd, Eu, Dy, Ho, Gd, Er, Tm, Yb, and Y) in these oxides are determined. The procedure for direct arc atomic emission analysis of yttrium, gadolinium, and neodymium oxides to detect rare earth impurities within the range of 0.001–0.1 wt % is elaborated; the procedure is characterized by improved metrological parameters compared to the standard method.
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