Abstract
AbstractIn this work we report on the results of some static time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) experiments performed on low‐molecular‐weight narrow distribution polystyrene. Evidence of cross‐linking during analysis is found, as indicated by the presence of peaks corresponding to molecules formed by linking of two initial polymer chains. The effect, which can be easily taken into account, does not appreciably affect the molecular weight distribution parameters obtained. However, the observed phenomenon gives the indication that, at least in the case of particularly sensitive systems, ion beam‐induced modification can occur also in static SIMS experiments. In addition, the observed phenomenon can be of relevance in modelling the sputtering of large molecules.
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