Abstract
A coarse-fine dual-loop digital low dropout regulator (DLDO) having a binary weighed transistor array in the coarse loop and a 1-bit ΔΣ modulator in the fine loop is proposed. Compared with the conventional DLDO, the proposed architecture significantly reduces hardware complexity and alleviates matching requirement, enabling a robust DLDO design for low-voltage phase-locked loops. The proposed DLDO designed in 65 nm CMOS generates a noise-shaped output voltage whose peak value is <;1 mV with the load current ranging from 100 μA to 6 mA.
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