Abstract
The influence of plastic deformation on the diffusivity (D0) of the point defect in the passive film on Ti in 3.5% NaCl solution was investigated. Electrochemcial measurements including chronoamperometry measurement, electrochemical impedance spectroscopy and Mott-Schottky plots were performed, and the passive films were characterized by the Auger electron spectroscopy. The values of D0 were calculated based on the point defect model. The results shown that the passive film exhibited the n-type semiconductive property at different conditions. With the increased plastic deformation, the donor density and D0 increased, and the passive film became more defective. The relationship between D0 and stress corrosion cracking of Ti was discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
