Abstract
The diffusional flux associated with the motion of interfacial defects is described by an equation expressed in terms of the topological parameters which characterise defects, namely their Burgers vectors and step heights, the defect velocity and the concentration of each atomic species in the two adjacent crystals. This expression demonstrates that glide/climb behaviour of grain boundary defects is analogous to motion of dislocations in single crystals; climb motion results if a component of b is perpendicular to the interface plane. However, the situation is more complex in the case of interphase interface defects, but the present approach, which considers the step and dislocation portions of defects separately, enables a straightforward analysis. Several examples are illustrated to show the various possibilities, such as climb motion even when b is parallel to the interface, and glide motion when b is not. The latter case arises in martensitic transformation where the existence of an invariant-plane-strain relation at the interface leads to equal and opposite fluxes to the step and dislocation portions of transformation defects so that overall the motion is diffusionless.
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