Abstract
The exchange-biased electrode of magnetic tunneling junctions with under- and overoxidized AlOx insulator layers were annealed at 300 °C to study the extent of the Mn diffusion. A significant amount of Mn diffusion into the AlOx layer was observed in the overoxidized junction sample from Auger electron spectroscopy and the extent of Mn diffusion increased with increasing oxidation time. X-ray photoelectron spectroscopy (XPS) proved that Mn found at the CoFe/AlOx interface in the overoxidized junction sample was in the form of Mn oxide. The XPS data suggest that the Mn diffusion was accelerated by the preferential oxidation of Mn at the CoFe/AlOx interface.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
