Abstract
Thin films of CdSe are prepared by Physical Vapor Deposition technique. The nanocrystalline films have been investigated by Steady‐State Photocarrier Grating technique (SSPG) and Steady‐State photoconductivity measurements. The minority carrier diffusion length (Ldiff) is obtained both from the best fit of experimental photocurrent ratio β versus grating period (Λ) and from the “Balberg plot”. The grating quality factor (γo) is 0.85 indicating almost negligible surface roughness present in the sample.
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