Diffusion and light scattering in dispersions of charged particles with thin electrical double layers

Abstract

The perturbation approach of Barker and Henderson is applied to obtain analytical formulae for the collective diffusion coefficient, short-time self-diffusion coefficient, sedimentation velocity, static and dynamic structure factors at low particle concentration. All these quantities are expressed as explicit functions of the system parameters (particle size and charge, electrolyte concentration, Hamaker constant, etc.) and can be easily calculated if the latter are known. By using light scattering experiments information on the particle charge (or potential) and Hamaker constant can be obtained.