Abstract
The interfacial structures of self-assembled heterostructures through alternate deposition of conjugated and nonconjugated polymers were studied by x-ray reflectivity and nonspecular scattering. We found that the interfacial width including the effects of both interdiffusion and interfacial roughness (correlated) was mainly contributed by the latter one. The self-assembled deposition induced very small interdiffusion between layers. The lateral correlation length ${\ensuremath{\xi}}_{\ensuremath{\parallel}}$ grew as a function of deposition time (or film thickness) described by a power law ${\ensuremath{\xi}}_{\ensuremath{\parallel}}\ensuremath{\propto}{t}^{\ensuremath{\beta}/H}$ and was also observed from the off-specular scattering.
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