Abstract
The Maggi-Rubinowicz method (MRM) is a useful tool to compute diffraction patterns from opaque planar objects. We adapted the MRM to planar rectangles. In the first part of this study, differences between diffraction patterns, both the intensity and the phase distributions, from a tilted rectangle and from the square having the same orthogonal projection on the observation plane, have been analyzed. In the second part, we compared results obtained with the MRM to those obtained with angular spectrum theory (AST) coupled to fast Fourier transform (FFT). The main novelty of this work is the fact that MRM is particularly well suited for evaluating anti-aliasing procedures applied to AST-FFT calculations.
Highlights
The phenomenon known as diffraction has been studied for almost four centuries
The first objective of this paper is to present simulation results obtained with the Maggi–Rubinowicz method (MRM) for opaque planar objects
The simulations performed in this study demonstrate that the Maggi–Rubinowicz method is a flexible tool to compute diffraction patterns from opaque planar objects
Summary
The phenomenon known as diffraction has been studied for almost four centuries Most of these studies are based on the Huygens–Fresnel principle which states that every point of a wavefront may be considered as a source of secondary spherical wavelets, and the wavefront at any later instant may be regarded as the envelope of these wavelets [1]. The diffraction pattern produced by an object with large dimensions and at large distances compared to the wavelength can be computed by the scalar diffraction theory resulting from Green’s theorem applied to the Helmholtz wave equation [2]. A second objective is to compare diffraction patterns computed with the MRM and the AST-FFT in order to evaluate performance of a low-pass filter employed along with the AST-FFT calculations.
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