Abstract
We observed energy-filtered extinction contours in silicon and copper crystals using an imaging-filter system. The observed contrasts are discussed and compared to a theory describing diffraction effects in inelastic scattering. The experimental results are evaluated for three mapping methods widely used in electron spectroscopic imaging. We show that quantification errors caused by diffraction effects range from 10% up to a factor of three.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
