Diffraction Contrast in TEM Images of Modulated Semiconductor Alloys

S P Ahrenkiel

doi:10.1007/978-94-015-8971-0_32

Diffraction Contrast in TEM Images of Modulated Semiconductor Alloys

S P Ahrenkiel

https://doi.org/10.1007/978-94-015-8971-0_32

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Publication Date: Jan 1, 1997

Affiliation: National Renewable Energy Laboratory

#Transmission Electron Microscope Images #Transmission Electron Microscope + Show 8 more

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Abstract

Composition modulation is detected in transmission electron microscope (TEM) images and diffraction patterns of several technologically important semiconductor materials, including ZnSe05Te05 alloys and (AIAs)/(InAs) short-period superlattices (SPSs) [1,2]. Here we examine calculated and experimental diffraction contrast in TEM images.

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