Abstract
Imaging techniques often suffer from distortion effects. Former methods of reducing these distortions have been based either on improving the imaging technique (i.e., to avoid distortions) or on the use of reference samples (i.e., to determine the distortion field by imaging of a known structure. We present a novel method of correcting image distortion by evaluating the imaged position changes due to two small sample position shifts. The algorithm allows us to calculate a vector field, which enables us to determine the "undistorted" position of any point of the image. The presented method has very low presuppositions about the sample, requires no reference samples, and is applicable to any type of image distortion. In addition to the presentation of the method's theoretical basis and a description of the computational method, we present corrected secondary ion mass spectroscopy (SIMS) images of a regular structure (a copper grid) as well as a stochastic distribution (sodium impurities) to show the results of empirical data.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
