Abstract
A new approach to electron diffraction is presented that eliminates almost all of the inelastic scattering signal without any energy filtering hardware. It makes use of changes in specimen thickness alone to cancel the thickness insensitive signal in electron diffraction patterns and is readily demonstrated in convergent beam electron diffraction (CBED). Most notably, the method removes the signal due to thermal diffuse scattering (TDS) as well as Borrmann effects [1] and can be used in conjuction with hardware energy filtering. The present work explains and explores the new method in application to the measurement of structure amplitudes (structure factors) by pattern-matching refinement of CBED patterns.
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