Abstract
The microstructures of laser deposited c-axis oriented YBa 2Cu 3O 7-δ (YBCO) thin films have been characterised by scanning and transmission electron microscopy. Grain boundaries were produced using substrates with wavy step edge profiles on cubic (001) LaAlO 3. The wavy step edge profiles simulated a meandering profile which may arise due to uneven etching of mask and substrate during conventional pattering procedures. The nucleation rate of the a-axis oriented film in the step region varied along the wave profile. The results indicate that a well defined grain boundary geometry and behaviour require a straight step profile on a sub micron scale. In addition, the YBCO nucleation in the step region can be suppressed by choosing a step direction which deviates from the [100] LAO and [010] LAO.
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