Abstract
Theoretical and experimental results are presented for the electron-impact ionization of ${\mathrm{Sc}}^{2+}$ in the near-threshold energy region where strong resonance features due to dielectronic capture processes are found. The indirect ionization contributions are calculated in the close-coupling approximation. Both absolute and scan measurements for the ionization cross section are obtained in a crossed-beams experimental geometry. The overall agreement between theory and experiment is good, once a sufficient number of singly excited states are included in the close-coupling expansion. The additional states allow a proper theoretical determination of the decay pathways available to the resonances formed following dielectronic capture of the incident electron.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
