Abstract
Publisher’s Note: This paper, originally published on 12 July 2016, was replaced with a corrected/revised version on 26 July 2016. If you downloaded the original PDF but are unable to access the revision, please contact SPIE Digital Library Customer Service for assistance. We have developed a terahertz time domain spectroscopy system (THz TDS). For THz generation, optical rectification process and for detection, electro-optic sampling processes are used. Identical cut ZnTe crystals are used for both generation and detection of THz radiation.This spectroscopy system can be used for the noninvasive and contactless electrical and optical characterizations of various samples. In this work spectroscopic measurements of pure, Chromium and Indium doped GaSe crystals within 0.4 THz to 3 THz range are taken by the developed set-up to study the dielectric response of the samples.
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