Abstract
The improved compared to a rectangular TE102 cavity geometry of a dielectric resonator (DR) suitable for studying thin films and coatings has been calculated and experimentally verified. It is shown that electron paramagnetic resonance (EPR) signal of SiOx films can be enhanced by using as the DR of two rectangular parallelepipeds fabricated from BaTi4O9 + 8.5% ZnO ceramics (ε=36) with dimension of 5.64×5.5 × 5.9 mm3 and a gap of up to 0.5 mm between them. Located inside a standard rectangular metal TE102 cavity of the X-band EPR spectrometer, the DR increases the filling factor by 5–12 times depending on the size of a sample studied. The experimental use of the DR allows to increase the EPR signal of the 950 nm SiOx thin film by a factor of approximately 4.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
