Abstract
Dielectric response of Y3Fe5O12 ceramics was investigated over broad temperature and frequency ranges. Three dielectric relaxations were identified in the temperature range from 125to620K. A Debye-type dielectric relaxation at low temperatures (125–320K) with an activation energy of 0.29eV is shown to originate from the carrier hopping process between Fe2+ and Fe3+. In a higher temperature range (320–620K), a low frequency (f≦10kHz) dielectric relaxation with an activation energy of 0.84eV most likely arises from the inhomogeneous structure, such as grain boundaries. Another dielectric relaxation in a wider frequency range has a similar activation energy with conduction (Ea=1.00eV) suggests that it can be attributed to the conduction.
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