Abstract
La2Ti2O7 ceramic samples were prepared via conventional solid-state reaction route. The dielectric properties of La2Ti2O7 were investigated as functions of temperature (113–1073 K) and frequency (100 Hz–1 MHz). Our results revealed that La2Ti2O7 ceramics exhibit intrinsic dielectric response with a dielectric constant of ∼57 in the temperature range below 250 K. Three thermally activated dielectric relaxations were observed when the temperature higher than 250 K. The low-temperature relaxations R1 with the activation energy of 0.38 eV is found to be a polaron relaxation results from hopping holes. The high-temperature relaxations R2 and R3 are related to the conduction progress associated with the singly and doubly ionized oxygen vacancies, respectively.
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