Dielectric relaxation of Y1−xRxFeO3 (R = Dy, Er, x = 0, 0.5)

Abstract

The ceramic samples Y1−xRxFeO3 (R=Dy, Er, x=0, 0.5) are synthesized by the solid-state reaction technique. The crystal symmetries of the synthesized materials have been obtained from the Rietveld refinement of the X-ray diffraction patterns at room temperature (303K). The homogeneity of the constituent elements and the grain sizes of the samples are determined by scanning electron microscope study. Impedance spectroscopy study of the samples has been performed in the frequency range from 50Hz to 1MHz and in the temperature range from 303K to 503K. Dielectric relaxation peaks are observed in the imaginary parts of the spectra. The frequency dependence of real and imaginary parts of dielectric permittivity is analyzed using modified Cole–Cole equation. The temperature dependence relaxation time is found to obey the Arrhenius law having activation energy ∼0.27eV which indicates that the conduction mechanism in the samples may be due to the polaron hopping based on the electron carriers. The complex impedance plane plots of the samples indicate the presence of both grain and grain-boundary effects and are analyzed by an electrical equivalent circuit consisting a resistance and constant phase element. The frequency dependent conductivity spectra are found to follow the power law.