Abstract
AbstractA new method for the determination of the dielectric properties of thin liquid films between metal surfaces is reported. The distance dependence of the dielectric constant εs, near the solid surface is introduced to be equation image where εb is the bulk value of the dielectric constant: x is a distance coordinate and α and β are parameters which can be evaluated on the basis of a theory founded on the model of a spherical/flat condenser plate system.A detailed description of the experimental set‐up is given. First results show that the dielectric constant in thin liquid layers can be altered when these exhibit a molecular long‐range orientation, which was detected by other methods.
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