Dielectric properties of doped polystyrene and polymethylmethacrylate

Abstract

About 1 μm thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) doped with diphenylsulfoxide (DS) up to 40 wt.% were prepared from solutions using spin-coating method. Glass transition temperature (T g) of doped polymer films was determined by DSC technique. The depth profile and surface concentration of DS dopant were measured by RBS and XPS methods, respectively. The temperature dependence of relative permittivity of the films was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) was measured using a standard Sawyer–Tower circuit. The glass transition temperature T g of both composites was found to be decreasing function of the DS concentration. The DS doping leads to an increase of relative permittivity of the PS and PMMA films. RBS and XPS measurements reveal an outward diffusion of DS dopant in PS/DS films at elevated temperature. No such effect was observed in PMMA/DS films. PMMA/DS layers were found to be more thermally stable comparing to PS/DS.