Abstract
ABSTRACT A 20 wt.% of MgO added (Ba0.6Sr0.4)TiO3 (BST:MgO) thick film have been fabricated by a tape casting and firing method for tunable microwave applications. In order to improve ferroelectric properties, the composite BST:MgO thick films have been asymmetrically annealed by a focused beam method. Dielectric constants of BST:MgO films are changed from 1050 to 1300 at 100 kHz after 150 s annealing by the focused beam. Even though it was not observed any prominent changes from the thick films before-and after-annealing in terms of chemical composition and surface morphology, it is clear that the average particle size of the thick films calculated by Scherrer's formula were increased by annealing. Furthermore, a strong correlation between particle size and dielectric constant of the BST:MgO has been observed; dielectric constant increases with increased particle size. This has been attributed to the increased volume of ferroelectric domain due to increased particle sizes.
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