Abstract
The dielectric properties of CCTO with addition Al2O3 prepared via solid state reaction investigated and reported at 1 GHz. With addition Al2O3 from 20 wt% to 80 wt%, secondary phase starts appear in XRD analysis such as copper dialuminium oxide (CuAl2O4), calcium titanate (CaTiO3) and titanium oxide (TiO2). These secondary phases show great influence on morphology and grain size of Al2O3/ CCTO composites. Hence, the addition of only 20 wt% Al2O3, the dielectric constant of CCTO reduce almost 50% and tangent loss is in between 0.0028 to 0.0630 which is very low and this characterization is suitable to use in electronic application in high frequency range.
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