Abstract
Lead-free ferroelectric Na0.5Bi0.5TiO3 (NBT) thick films were successfully fabricated on LaNiO3/Si (100) substrates by using a polyvinylpyrrolidone (PVP)-modified sol–gel technique. The dielectric properties, energy-storage performance and leakage current characteristics were investigated in detail. At 100kHz, the capacitance density of the NBT thick films was 295nF/cm2. The maximum recoverable energy-storage density and efficiency of the sample were 12.4J/cm3 and 43% at 1200kV/cm, respectively. A low leakage current density of about 1×10−5A/cm2 was also obtained at 700kV/cm at room temperature. These results indicated that the lead-free ferroelectric NBT thick films might be the promising candidates for high energy-storage capacitors application.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
