Abstract

The ac conductivity and relaxation mechanism in Ag(Ta,Nb)O3 ceramics have been investigated systematically. The formation of the ceramics was checked by an X-ray diffraction (XRD) technique analysis. The dielectric permittivity and the loss tangent of the Ag(Ta,Nb)O3 specimen were measured in a frequency range from 1 to 100 kHz at the various temperature ranges (30–110°C). A study on dielectric properties reveals the electrical relaxation phenomenon occurs in the material. Studies on the frequency and temperature dependence of ac conductivity of the Ag(Ta,Nb)O3 ceramics suggest that conduction process in the material is thermally activated process. In this paper, we will discuss the dielectric properties and the ac conductivities of Ag(Ta,Nb)O3 ceramics in relation to the electrical conduction process.

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