Abstract
Polycrystalline of [( Na 0.535 K 0.480)0.966 Li 0.058] (Nb 0.90 Ta 0.10) O 3 samples were prepared using the high-temperature solid-state reaction technique. X-ray diffraction (XRD) analysis indicates the formation of a single-phase with orthorhombic structure. AC impedance plots were used as tool to analyze the electrical behavior of the sample as a function of frequency at different temperatures. The AC impedance studies revealed the presence of grain effect, from 425°C onwards. Complex impedance analysis indicated non-Debye type dielectric relaxation. The Nyquist plot showed the negative temperature coefficient of resistance (NTCR) characteristic of NKLNT. The AC conductivity results were used to correlate with the barrier hopping (CBH) model to evaluate the binding energy (Wm), the minimum hopping distance (R min ), the density of states at Fermi level (N(Ef)), and the activation energy of the compound.
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