Abstract
The real dielectric constant ε′ and dielectric loss factor tan δ were studied asfunctions of frequency f, temperature T, and composition x for NixMg1-xFe2O4 system ferrites with x = 0, 0.2, 0.4, 0.6, 0.8, and 1 prepared using the usual ceramic technique. The experimental results indicated that ε′ and tan δ decrease as the frequency and Ni ion substitution increase and as the temperature decreases. The observed values of ε′ are high. Dielectric relaxation processes (peaks) were observed in the tan δ curves at relativly high temperatures but were not visible in the ε′ curves. The dielectric relaxation frequencies fD were found to be shifted to higher values as the temperature increased. The activation energy ED for the dielectric relaxation and relaxation frequency fo at infinitely high temperature were found to increase as the Ni ion substitution increased.
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