Abstract
The authors have succeeded in observing the dielectric anomaly in ferroelectric strontium bismuth tantalate (SBT) thin films, and studied how it varies with film composition. For a stoichiometric SBT film, the dielectric anomaly was diffused, and the Curie temperature (Tc) was approximately 260 °C, which is lower than that for the bulk ceramic. A SBT film with excess Bi composition showed Tc of approximately 300 °C, and Tc for Sr deficient SBT films was higher than 340 °C. The composition dependence of remanent polarization and coercive field near room temperature for the SBT films reflects the composition dependence of the Tc values.
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