Abstract
Growth of MgTiO3 (MTO) film on SrTiO3 (STO) coated substrate of three different thicknesses (abbreviations: STMT1, STMT2 and STMT3) by R.F. sputtering technique, and their optical, dielectric and electrical responses have been reported. The XRD analysis revealed polycrystallinity and lattice strain. The STMT bilayers showed MTO thickness dependent granular topography. The estimated optical band gaps are found to be in the range of 3.735–3.727 eV. The dielectric constant showed inverse dependency with MTO thickness, and remained almost invariant with temperature (303–350 K). Impedance analysis established a correlation with the microstructures. The leakage current (J = 10−6 A/cm2 for E = 200 kV/cm) analysis revealed: Schottky conduction and space charge limited mechanism conduction in the lower and higher field regions, respectively. The slope of C vs. V is found to be 259 µF/V. The obtained characteristics of STMT bilayers are potential candidates for large band gap optical and electronic integrated circuit applications.
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