Abstract
The “Method of Binary Ratios” is a powerful universal calibration method of X-ray fluorescence (XRF) and optical emission spectrometry (OES) where a functional relationship between the binary intensity and content ratios has to be established. It is shown that a logarithmic regression may be applied if the relative precision of the measurement is constant, and that this requirement is frequently met during the analysis of major and minor components. The scheme of calculation is presented and the interrelationship involving the calibration function of B eattie und B rissey on the one hand, and of S cheibe und L omakin on the other, is constructed. In addition, it is shown that there is considerable improvement in accuracy, because “multiplicative” errors are compensated to a great extent by forming intensity ratios. The relative standard deviation s r( c) proves to be dependent on the content according to s ro· (1 - c). For a large number of analyses the figure of merit s ro was found to be in a range between 1 and 3%.
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