Abstract
ABSTRACTA new analytical method for amorphous silicon solar cells, called DICE (dynamic inner collection efficiency), has been developed. The depth profile of the photovoltaic characteristics of solar cells under any operating condition are obtained by this method in a non-destructive way for the first time. It was experimentally confirmed by the DICE characterization that 1ight-induced deterioration does not occur homogeneously in the thickness direction of the I-layer, and that the main deterioration region in the I-layer changes according to the duration and load condition of light exposure.The DICE method also contributed to an improvement in the conversion efficiency of two kinds of a-Si solar cells, an integrated-type submodule and a new type of ultralight flexible module. A total area efficiency of 10.6% was obtained with a size of 10 cm × 10 cm integrated-type a-Si solar cell submodule on a glass substrate, and the world's highest powet—to-weight ratio of 275 mW/g was achieved in the flexible module on a plastic film.
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