Abstract
With the use of multiresolution wavelet analysis, the possibilities of diagnosing changes in the dynamical regimes of complex systems from transient processes depending on the rate of variations of control parameters are studied. Estimates are made of the minimum sample size that allows diagnosing a change in the dynamical regime of systems with self-sustained oscillations on the example of transient processes during the formation or destruction of synchronous chaotic oscillations. Keywords: multiresolution analysis, random process, nonstationarity, wavelet.
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