Diagnosis of SMGF in ESOP Based Reversible Logic Circuit

Abstract

Testing of reversible circuit is an important issue to assure the quality and reliability of the reversible quantum circuit. Several fault models like Single Missing Gate Fault (SMGF), Partial Missing Gate Fault (PMGF), Multiple Missing Gate Fault (MMGF) and Repeated Gate Fault (RGF) have been predicated for better representation of faults in reversible quantum circuits. In this work, we develop an algorithm for diagnosis of Single Missing Gate Fault (SMGF) in exclusive-or sum of product (ESOP) based reversible circuit. Without using conventional testing technique where test vectors are generated to detect the fault, we present boolean expression based testing technique which produces the faulty gate details as a product term in boolean expression. The developed testing technique first detects the fault, then identifies the fault and finally corrects the erroneous part of the circuit to make it fault free.