Abstract
level, is given by the various spectroscopies, spanning the electromagnetic spectrum. In the present review we describe a structure probe based on a spectroscopy (X-ray absorption spectroscopy) but for which structure information can be deduced due to a diffraction-like phenomenon. Specifically, extended X-ray absorption fine structure (EXAFS ) spectroscopy consists of measuring the absorption spectrum of matter for X rays with photon energies (or wavelengths) in the vicinity of the absorption edges that char acterize the elements present in the material. Such spectra show modulation, called fine structure, of the X-ray absorption coefficient and this is present because photoelectrons released from the X ray absorbing atoms backscatter coherently from neighboring attoms. In this sense, EXAFS spectroscopy, although in volving X rays, is a structure probe because of an electron scattering
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