Abstract
AbstractA visualization method of grain boundaries in a polycrystal was developed at BL28B2 in SPring‐8. By combining a scanning type white X‐ray micro‐diffraction system with high‐energy synchrotron X‐rays we non‐destructively obtained images to visualize grain boundaries and grains in stainless steel by simple data processing. The images were comparable to those obtained by electron back scattering pattern technique. It was shown that the new method can be applied to bulky plate sample as thick as 300 µm containing grains with size of 100 µm.
Published Version
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