Abstract
Microwave reflectometry is an invaluable diagnostic tool for measuring electron density profiles in large fusion devices. Density fluctuations near the plasma cutoff layer, particularly those that are time-varying on the timescale of the reflectometry measurement, can result in distortions in phase and/or amplitude of the reflected waveform, which present challenges to the accuracy of the reconstructed profile. The ultra-short pulse reflectometry (USPR) technique eliminates the time-varying issue in that reflectometry data are collected on a nanosecond timescale, essentially freezing the fluctuations in place. An X-mode dedicated 32-channel USPR system has been developed and installed on the EAST, covering the operation frequency range from 52 to 92GHz. This system enables high-resolution density profile measurements in the plasma pedestal and scrape-off layer, with resolutions reaching 5mm and 1 μs, respectively. Laboratory testing of the system performance has been conducted, demonstrating the potential of the USPR technique to provide accurate and high-temporal-resolution density profiles in challenging plasma environments.
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