Abstract
New calibration equations are proposed based on the use of intensity ratios of spectral lines and peaks of coherently and incoherently scattered characteristic radiation of an X-ray tube. Prospects for their application to the X-ray fluorescence analysis of samples containing undetectable light elements are shown. The proposed method ensures high precision of determination and performance of analysis in the lack of adequate reference samples. The method was tested on an example of analysis of standard samples of bronze and samples of iron oxide materials.
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