Abstract
Two types of specimen holders have been developed for in situ measurements of electrical properties during microstructural observation in a high voltage electron microscope (HVEM). Each specimen holder contains an electrode cell consisting of electrodes, a heater, a thermocouple and a base made from MACOR insulating ceramic. The temperature dependence of the electrical conductivity in ZrO2-3mol% Y2O3 (YSZ) and the dielectric loss in MgO have been investigated without irradiation for evaluating the reliability and the limitation of the specimen holders. YSZ specimens were irradiated with 1 MeV electrons at temperatures from 450 K to 870 K in the HVEM. The radiation induced electrical conductivity was detected by in situ measurements. The dielectric loss in MgO was also measured and found to increase under electron irradiation.
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