Abstract

At TIARA facility in JAERI Takasaki, the single-ion hit technique combined with heavy ion microbeam has evolved in conjunction with developments in applied research such as the study of single-ion irradiation effects in semiconductors or biological cells. This technique is the most effective tool for the investigation of individual phenomena induced by single-ion injections to local areas of those samples, which have micron-scale structures. Adding a feature of position detection for the study of single event effects in semiconductor nano- or quantum devices is regarded as the next stage in the development of the single-ion hit technique.

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