Abstract
X-ray computed tomography (XCT) has been increasingly used for dimensional metrology. However, the impact of systematic errors has not been well studied. Typical systematic errors of XCT includes scattering, beam hardening, cone beam errors etc. The impact of these systematic errors on dimensional metrology is an on-going research topic. At the United Kingdom’s National Physical Laboratory a set of reference samples have been developed to study the impact of these systematic effects, especially when measuring metal components. The samples developed include the stair case reference sample, the additive manufacturing (AM) reference sample and the large industry reference sample. The paper discusses the establishment of reference data for XCT using traceable measurement instruments and the applications of these samples in investigating the impact of systematic effects.
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