Abstract
• HIPed interface of F82H steel was analyzed using high energy X-rays (115.56 keV). • The analysis revealed the presence of SiO x and TaO x at the HIP interface and W accumulation near the HIP interface. • The high energy X-ray spectra can be a non-destructive testing (NDT) technique for a HIPed interface of F82H steel. High energy X-rays (115.56 keV) were used to measure the HIPed interface of F82H steel. The X-ray energy spectra of the samples were analyzed focusing on W and Ta fluorescence X-rays, Compton scattering and elastic scattering X-rays. The results suggest the presence of SiO x and TaO x at the HIP interface and the accumulation of W near the HIP interface. These results indicate that high-energy X-ray spectrum analysis can be a non-destructive testing technique (NDT) to evaluate precipitates at the HIP interface of F82H steel.
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