Abstract
A new technique of real-time phase-shift interferometry was developed for precise in situ observation and measurement of crystal growth. The new signal processor employs an “intelligent” phase unwrapping technique and enables the three-dimensional surface profile of a crystal to be obtained in real time even in the case that a two-dimensional phase distribution profile becomes discontinuous in the conventional signal processor due to dust or small crystals adsorbed on the crystal surface. This interferometry was applied to surface observation of a barium nitrate crystal growing from an aqueous solution.
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